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Novel planar antenna measurement techniques with electro-optic sampling (EOS)

机译:带有电光采样(EOS)的新型平面天线测量技术

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This paper has proposed a new antenna assessment technique. Antenna radiation patterns are measured using electro-optic sampling (EOS). The electric field of a microstrip-fed patch antenna is measured by an EO probe tip and the radiation pattern is theoretically calculated. The calculation results are compared against the conventionally determined far-field pattern. The experimental results confirm the effectiveness of the proposed method. The method is suitable for planar antennas, very small MMIC antenna arrays, i.e., wafer scale integrated circuits (WSICs), and evaluating the mutual coupling of large scale phased arrays.
机译:本文提出了一种新的天线评估技术。天线辐射方向图是使用电光采样(EOS)进行测量的。微带馈电贴片天线的电场通过EO探针尖端进行测量,并从理论上计算出辐射方向图。将计算结果与常规确定的远场模式进行比较。实验结果证明了该方法的有效性。该方法适用于平面天线,非常小的MMIC天线阵列(即晶圆级集成电路(WSIC))以及评估大型相控阵的相互耦合。

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