首页> 外文会议> >Ultra high resolution sub-bottom profiling for detection of thin layers and objects
【24h】

Ultra high resolution sub-bottom profiling for detection of thin layers and objects

机译:超高分辨率亚底轮廓分析,可检测薄层和物体

获取原文

摘要

Due to the increased focus on polluted sedimentation and detection of buried objects a sub-bottom profiler suited for application in detection thin sediment layers and buried objects has been developed. The system is based on a parametric array for producing very narrow, low frequency beams. The acoustic beam can be steered electronically to both sides making it possible to cover a 3D volume of sub-bottom sediments as the profiler is moved ahead. Furthermore this type acoustic source has an inherent high relative bandwidth and virtually no ringing resulting in a very high spatial resolution. Examples of results obtained with the system are shown.
机译:由于人们越来越关注污染的沉积物和掩埋物体的检测,因此开发了一种适用于探测薄薄的沉积物层和掩埋物体的亚底部轮廓仪。该系统基于用于产生非常窄的低频光束的参数阵列。声束可以通过电子方式转向两侧,从而可以在剖面仪向前移动时覆盖3D体积的底部沉积物。此外,这种类型的声源具有固有的高相对带宽,并且实际上没有振铃,从而导致很高的空间分辨率。显示了使用该系统获得的结果示例。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号