Full wave characterization of microstrip open end discontinuities patterned on anisotropic substrates using potential theory

摘要

A technique for the full-wave characterization of microstrip open end discontinuities fabricated on uniaxial anisotropic substrates using potential theory is presented. The substrate to be analyzed is enclosed in a cut-off waveguide, with the anisotropic axis aligned perpendicular to the air-dielectric interface. A full description of the sources on the microstrip line is included with edge conditions built in. Extension to other discontinuities is discussed. Results for several different anisotropic substrates as a function of microstrip line width are shown.