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Coupling phenomena in conductor-back slotline structures

机译:导体背槽线结构中的耦合现象

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Leakage phenomena possible in conductor-backed slotlines are investigated through an analysis of coupled slotlines for possible application to a nonproximity directional coupler. Two coupled slotlines with finite width of the conductor backing are analyzed using the spectral domain method. The propagation constants and experimental results obtained confirm that coupling is caused by leakage through the conductor backing. It is shown that the slotlines couple with each other even if they are physically separated by a large distance. The coupling phenomena were confirmed through an experiment on forward-coupling directional couplers. It was found possible to prevent the leakage by adding an additional top layer.
机译:通过对耦合的缝隙线的分析,研究了导体支持的缝隙线中可能发生的泄漏现象,以可能应用于非邻近方向耦合器。使用频谱域方法分析了具有有限宽度的导体衬背的两条耦合的缝线。传播常数和获得的实验结果证实,耦合是由导体背衬泄漏引起的。可以看出,即使槽缝线在物理上相距很远,它们也会彼此耦合。通过对前向定向耦合器进行的实验证实了耦合现象。发现可以通过添加额外的顶层来防止泄漏。

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