Sixth Annual IEEE International ASIC Conference and Exhibit

摘要

The following topics are dealt with: analog and mixed signals; design for test; physical layout; digital signal processing applications; advanced topics in test; architecture and applications; data processing devices and applications; hardware-description-language-based methodology; design and education; application-specific integrated circuit manufacturability and cell library management; field programmable gate arrays; telecommunications; high-level synthesis; interface buffers for mixed voltage and high-performance drivers; integrated circuits for optical communications; modeling and simulation; computer-aided design for packaging; neural network; and image coding.