Test pattern generation for current testable faults in static CMOS circuits

摘要

Many manufacturing defects in static CMOS circuits are not detected by tests generated using the traditional single stuck-at fault model. May of these defects may be detected as increased propagation time or as excessive quiescent power supply current (IDDQ). In this paper the authors consider the probable manufacturing defects and compare the costs of detecting them by the resulting excess IDDQ versus the cost of traditional testing methods.