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The poling field and drawing dependence of the structure of piezoelectric poly(vinylidene fluoride) F2-ME films: IR and X-ray studies

机译:压电聚偏二氟乙烯F2-ME薄膜结构的极化场和拉伸依赖性:IR和X射线研究

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IR (infrared)-transmission spectra as dependent on poling field and drawing in PVDF (F2-ME) corona poled films was recorded in the 400-4000 cm/sup -1/ range with a diffraction spectrometer and in the 20-600 cm/sup -1/ range with a Fourier spectrometer. Libration mode absorption bands at 67 and 58 cm/sup -1/ due to TTT and TGTG-conformations may be used for estimation of beta - and alpha -phase contents, respectively X-ray diffraction spectra for the radiation direction coincided with the drawing direction of multilayered specimens showing 001 beta and 002 alpha reflections. The drawing ratio dependence of the piezoelectric coefficient d/sub 31/ exhibited a maximum attributed to beta -phase to amorphous phase transformation at large drawing ratios.
机译:取决于极化场和在PVDF(F2-ME)电晕极化膜中绘制的红外(红外)透射光谱用衍射光谱仪记录在400-4000 cm / sup -1 /范围内,而在20-600 cm /傅立叶光谱仪的sup -1 /范围。由于TTT和TGTG构象,在67和58 cm / sup -1处的振动模式吸收带可用于估算β相和α相的含量,分别是辐射方向与绘制方向一致的X射线衍射光谱显示001 beta和002 alpha反射的多层标本。压电系数d / sub 31 /的拉伸比依赖性表现出在大拉伸比下归因于β相至非晶相转变的最大值。

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