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Electrical Contacts - 1991. Proceedings of the Thirty-Seventh IEEE Holm Conference on Electrical Contacts (Cat. No.91CH3066-8)

机译:电气触点-1991年。第37届IEEE霍尔姆电气触点会议论文集(目录号91CH3066-8)

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摘要

The following topics are dealt with: the make erosion mechanisms of Al/CdO and Ag/SnO/sub 2/ contacts; current-limiting switching by squeezing arcs into narrow insulating slots; Vickers microhardness evaluation of multilayer platings for electrical contacts; copper-graphite brushes lined with porous metals; electrical contact failure mechanisms relevant to electronic packages; glowing contact areas on loose copper wire connections; and limitations and requirements for low force contacts in high-density systems.
机译:处理以下主题:Al / CdO和Ag / SnO / sub 2 /触点的制造腐蚀机理;通过将电弧挤压到狭窄的绝缘槽中来进行限流开关;电触点多层镀层的维氏显微硬度评估;衬有多孔金属的铜石墨电刷;与电子封装有关的电接触故障机制;松散的铜线连接上有灼热的接触区域;高密度系统中低力接触的局限性和要求。

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