A PC-based automated guided probe testing system

摘要

The physical structure of the PC-based guided probe testing system is presented. Major components of the system are shown, and a discussion of their functioning within the system is given. The guided probe algorithm that is used to locate an error is an analytic process. A typical automatic test pattern generation system will start by simulating a number of random test patterns in order to obtain expected responses and cover a percentage of possible faults. Testing strategies that provide insight into the efficient testing of printed circuit boards are discussed.