PANORAMIC INTERFEROMETRY

摘要

The fundamentals and operation principles of panoramic interferometers are presented. This is a new class of measurement instruments designed to study the strain state of axisymmetric objects less than 0.1 m in diameter. Three directions are presented in this class: holographic interferometry, speckle interferometry, and holographic tomography. The first direction has been developed theoretically and experimentally, and effectively used in industry, the second direction has been verified in laboratory conditions, the third one is in theoretically and experimentally elaboration. High-sensitive panoramic interferometry is free of a number of principal metrological and technical constraints inherent in the traditional methods of experimental mechanics. Panoramic interferometers are simple and compact, they save labor efforts by taking several aspects of an object on one hologram. On the basis of one hologram, the instruments allow to obtain the displacement vector components of all points of the deformed surface with equal sensitivity.