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PRECISE AND ROBUST PHASE MEASUREMENT ALGORITHMS

机译:精确和稳健的相位测量算法

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Explicit analytical expressions for families of 3-point, 4-point, 5-point, and 6-point (m-point) phase-measurement formulas are presented, which are exactly valid for 1, 2, 3, 4, (m-2) different values of the phase-steps, applied in the sequence of intensity-measurements. These values are the "design phase-steps", which can be chosen in accordance with the actual necessity. These formulas are equally suited for the temporal as well as for the spatial case. In the spatial case, the formulas can be used as components to design very compact two dimensional convolution kernels, which lead to high spatial resolution and minimized sensitivity to higher-order miscalibration errors. We also present formulas with m points, which have (m-2) design phase-steps located symmetrical with respect to π/2. These formulas give the lowest errors over the largest range. Finally we present formulas which are insensitive to linear phase-shifter calibration errors and at the same time to nonlinearity of the intensity measurements or non-cosine fringe profiles. The basic theory to derive these formulas and to design two dimensional convolution kernels was established by the author in 1986 and applied during the production of the ESO-NTT primary from 1986 to 1987 within the Carl Zeiss company. It was patented by Carl Zeiss, was called the "Direct Measuring Interferometry" (DMI) method, and implemented in the Laser-Interferometer DIRECT 100, which has realtime wavefront measuring and evaluating capability on a set of 480 X 480 measurement points. The features of this method have been presented in different papers, the theory behind some of the formulas is given in greater detail in [7].
机译:给出了三点,四点,五点和六点(m点)相位测量公式族的显式解析表达式,这些表达式对于1、2、3、4(m- 2)在强度测量序列中应用不同的相位步长值。这些值是“设计阶段步骤”,可以根据实际需要进行选择。这些公式同样适用于时间和空间情况。在空间情况下,这些公式可用作设计非常紧凑的二维卷积核的组成部分,从而导致较高的空间分辨率和对高阶错误校准误差的最小化灵敏度。我们还给出了具有m个点的公式,这些公式具有(m-2)个设计相位步长,它们相对于π/ 2对称。这些公式在最大范围内给出最低的误差。最后,我们提出了对线性移相器校准误差不敏感,同时又对强度测量或非余弦条纹轮廓的非线性不敏感的公式。作者于1986年建立了推导这些公式并设计二维卷积核的基本理论,并在1986年至1987年在卡尔蔡司公司生产ESO-NTT初级产品时得到了应用。它由卡尔·蔡司(Carl Zeiss)申请了专利,被称为“直接测量干涉法”(DMI)方法,并在激光干涉仪DIRECT 100中实现,该器件在一组480 X 480个测量点上具有实时波前测量和评估功能。在不同的论文中已经介绍了该方法的特征,某些公式背后的理论在[7]中有更详细的介绍。

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