首页> 外文会议>International Zeolite Conference pt.A; 20040425-30; Cape Town(ZA) >ACCURATE MEASUREMENT OF THE THERMAL EXPANSION OF MFI ZEOLITE MEMBRANES BY INSITU HTXRPD
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ACCURATE MEASUREMENT OF THE THERMAL EXPANSION OF MFI ZEOLITE MEMBRANES BY INSITU HTXRPD

机译:用原位HTXRPD精确测量MFI分子筛膜的热膨胀

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摘要

Template removal by calcination of MFI type membranes is often accompanied by crack formation. The thermal behavior of MFI type membranes, synthesized with and without masking, was studied to understand the mechanism. Masking prevents growth of zeolite in the interior of the support during membrane synthesis. Rietveld refinements of powder diffraction data collected in situ at high temperature allowed to accurately determine the change in thermal expansion of the MFI film and the porous α-alumina support. During heating, a relatively large contraction of the cell volume during template removal occurred in the zeolite powder and in the film of the membrane prepared with masking. The much smaller decrease in the non-masked sample indicates that this membrane is under stress during heating and as a consequence, cracks are formed. The stress imposed in the membrane prepared without masking may be due to the opposite thermal behavior of the substrate in combination with strong bonds between the membrane and the support.
机译:通过MFI型膜的煅烧去除模板通常会伴随裂纹的形成。研究了带有或不带有掩膜的MFI型膜的热行为,以了解其机理。掩膜可防止膜合成过程中沸石在载体内部的生长。高温下现场收集的粉末衍射数据的Rietveld改进可以准确确定MFI膜和多孔α-氧化铝载体的热膨胀变化。在加热期间,在沸石粉末和通过掩膜制备的膜的膜中,在去除模板期间,细胞体积发生了较大的收缩。未掩盖样品中的减小量要小得多,这表明该膜在加热过程中处于应力作用下,因此会形成裂纹。在未加掩膜的情况下施加在膜上的应力可能是由于基材的相反热行为以及膜与支撑体之间的牢固结合所致。

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