首页> 外文会议>International Symposium on Instrumentation Science and Technology(ISIST'2006); 2006; Harbin(CN) >Non-contact Measurement of Damaged External Tapered Thread Based on Linear Array CCD
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Non-contact Measurement of Damaged External Tapered Thread Based on Linear Array CCD

机译:基于线阵CCD的非接触式锥形外螺纹损伤测量

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摘要

The non-contact measurement of external tapered thread based on linear array CCD is presented to decrease the measuring error caused by local damage area contrast to the measurement with mechanical gauges. The thread is scanned by linear array CCD and the signal is processed by first order difference to obtain thread contour. For the thread with damage on tooth flank and deformation on generating line, the Hough transform and weighted least squares are adopted to reduce the local defects and to set up fitted thread contour equations that can reflect the real dimension. Then the dimensions can be calculated based on these equations according to the definition. The paper also presents the method to evaluate the local damage. Experiment shows that the method is suitable for the measurement of damaged thread.
机译:提出了一种基于线阵CCD的外锥面非接触式测量方法,以减少局部损伤面积引起的测量误差。线阵CCD扫描线,并通过一阶差分处理信号,以获得线轮廓。对于螺纹齿面损坏且产生线变形的螺纹,采用霍夫变换和加权最小二乘来减少局部缺陷并建立可反映实际尺寸的拟合螺纹轮廓方程。然后可以根据定义根据这些方程式计算尺寸。本文还提出了评估局部破坏的方法。实验表明,该方法适用于螺纹损坏的测量。

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