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HIGH SHOCK PRESSURE MEASUREMENTS USING COMMERCIAL MANGANIN GAUGES

机译:使用商用锰规进行的高冲击压力测量

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摘要

The use of commercial manganin gauges is limited to shock pressures of about 20GPa, at which they fail by a fast short-circuiting effect in the polymeric layers encapsulating these gauges. It is commonly agreed that this short-circuit is the result of some high pressure chemical process in these polymer (epoxy, Kapton etc.), such as a phase transition or some bond rupture. The present paper explores this issue in order to better understand this short circuiting phenomenon. In particular, we wanted to find out whether the short circuit effect is pressure or temperature dependent. We present the results of five high pressure experiments in which epoxy encapsulated manganin gauges were loaded in a quasi-isentropic mode, in order to achieve much lower temperatures at high pressures. Under such isentropic conditions these commercial gauges did not fail at pressures as high as 60GPa. We shall show that gauge short circuiting is closely related to the high temperature phase transition of epoxy. With the results of our stress measurements, together with temperature estimates from 1D simulations, we were able to construct the phase line of epoxy in the pressure-temperature plane.
机译:商业化的锰测量仪的使用仅限于约20GPa的冲击压力,在该冲击压力下,由于封装这些测量仪的聚合物层中的快速短路效应而使其失效。通常认为,这种短路是这些聚合物中某些高压化学过程(环氧树脂,Kapton等)的结果,例如相变或某些键断裂。本文探讨了这个问题,以便更好地了解这种短路现象。特别地,我们想找出短路效应是压力还是温度的影响。我们介绍了五个高压实验的结果,其中以准等熵模式加载了环氧树脂封装的锰锰规,以便在高压下实现更低的温度。在等熵条件下,这些商用压力表在高达60GPa的压力下不会失效。我们将表明,规规短路与环氧树脂的高温相变密切相关。借助应力测量的结果以及一维模拟的温度估算,我们能够在压力-温度平面上构造环氧树脂的相线。

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