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Automatic Device Design Optimization with TCAD Frameworks

机译:使用TCAD框架自动进行设备设计优化

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摘要

A design optimization method is presented which utilizes automatic optimization capabilities within TCAD frameworks. This method is applied to doping profile optimizations of ultra-low-power CMOS transistors with 0.25 and 0.1 μm gate lengths. Two different performance goals are utilized, to maximize the drive current of an NMOS transistor and to minimize the gate delay time of a CMOS inverter stage. These optimizations result in an asymmetric doping profile with a channel peak near the source. Gaussian functions are used to simplify the doping structure without much of a performance loss. The inverter speed of the 0.1 μm technology is improved by almost 100% compared to an inverter with uniformly doped devices delivering the same off-state leakage current.
机译:提出了一种设计优化方法,该方法利用了TCAD框架内的自动优化功能。此方法适用于栅极长度为0.25和0.1μm的超低功耗CMOS晶体管的掺杂轮廓优化。利用了两个不同的性能目标,以最大化NMOS晶体管的驱动电流并最小化CMOS反相器级的栅极延迟时间。这些优化导致不对称的掺杂轮廓,其源极附近的沟道峰。高斯函数用于简化掺杂结构,而不会造成很多性能损失。与具有均匀掺杂器件且提供相同关态漏电流的逆变器相比,0.1μm技术的逆变器速度提高了近100%。

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