CREEP IN ELECTRONIC CERAMICS

摘要

High-temperature creep measurements combined with microstructural investigations can be used to elucidate deformation mechanisms that can be related to the diffusion kinetics and defect chemistry of the minority species. This paper will review the theoretical basis for this correlation and illustrate it with examples from some important electronic ceramics having a perovskite structure. Recent results on BaTiO_3, (La_(1-x)Sr_x)_(1-y)MnO_(3+δ),YBa_2Cu_3O_x, Bi_2Sr_2CaCu_2O_x, (Bi,Pb)_2Sr_2Ca_2Cu_3O_x, and Sr(Fe,Co)_(1.5)O_x will be presented.