Fault-Tolerant Neuromorphic Computing Systems

摘要

The emergence of non-volatile memories (NVM) such as resistive-oxide random access memory (RRAM), magnetoresistive random access memory (MRAM), and phase change memory (PCM) enables brain-inspired neuromorphic computing. However, due to immature fabrication process, NVMs are prone to process variations and manufacturing defects, which must be investigated for effective defect-to-fault mapping, high-coverage test generation, and diagnostics-driven yield learning. In this paper, we present a survey of research on fault modeling, test generation methodologies, and fault-tolerant design of neuromorphic computing systems based on RRAM and MRAM.