Admittance Spectroscopy of Nanoheterostructures: Computer-Controlled Data Acquisition and Modeling of Emission Processes

摘要

A computer-controlled complex of admittance spectroscopy has been developed, which allows one to perform a non-destructive diagnostics of key electronic parameters of bulk semiconductors and nanoheterostructures. The complex is essential both for research of nanoobjects (quantum wells, quantum dots, wetting layers etc.), and at the stage of device production for control of growth parameters and concentrations during doping processes. The created computer-controlled complex realizes both data acquisition and processing.