首页> 外文会议>Interferometry VI: Applications >Determination of the absolute order of one component of the surface displacement due to the evaluation of two interferograms of the specimen recorded under different loads
【24h】

Determination of the absolute order of one component of the surface displacement due to the evaluation of two interferograms of the specimen recorded under different loads

机译:通过评估在不同载荷下记录的样品的两个干涉图,确定表面位移的一个分量的绝对阶数

获取原文
获取原文并翻译 | 示例

摘要

Abstract: The holographic interferometry is a tool to detect internal defects of a specimen, due to the recording of the inhomogeneous surface deformation in the area of these defects. By means of a standard evaluation method, e.q. the phase-shifting, the Fourier-transformation or the heterodyning method, it is possible to determine the relative phase distribution of the interference pattern. However, for the quantitative evaluation it is necessary to evaluate the absolute fringe-order. A new method has been developed, which allows the determination of the absolute displacement, based on two interferograms of the specimen, recorded under different loads, provided that the dependence between the load and the displacement is linear.!5
机译:摘要:全息干涉术是一种检测样品内部缺陷的工具,这是由于记录了这些缺陷区域中不均匀的表面变形。通过标准评估方法,例如通过相移,傅立叶变换或外差法,可以确定干涉图案的相对相位分布。但是,对于定量评估,必须评估绝对条纹顺序。已经开发了一种新方法,该方法可以根据在不同载荷下记录的两个样本干涉图,确定绝对位移,前提是载荷和位移之间的相关性是线性的!5

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号