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The Study on LV Apparatus Testing Based on Infrared Image

机译:基于红外图像的低压仪器测试研究

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摘要

Based on the principle of infrared radiation, the formulas of the real temperature calculation of a target surface under various conditions were derived. Thereby we obtain the real difference in temperature between two points, so that formulate expressions of the relative temperature difference. And introduce some application of infrared imaging technique in the test of the fault of low-voltage apparatus.
机译:根据红外辐射原理,推导了各种条件下目标表面的真实温度计算公式。由此,我们获得了两点之间的实际温度差,从而表达了相对温度差的表达式。并介绍了红外成像技术在低压电器故障测试中的一些应用。

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