Birefringence measurement of glass ion-exchanged waveguides: burying depth or cover layer influence.

摘要

This paper deals with an experimental non-destructive technique for the measurement of polarization behavior of integrated optical waveguides. It is based on a high resolution polarimeter associated to an ellipsometric-type calibration which allows determining the full state of polarization of the output light. A magneto-optic perturbation is also added to generate TE/TM mode beating, whose spatial period is directly linked to the modal TE/TM birefringence. This equipment is first qualified by the measurement of modal birefringence in totally or partially buried ion exchanged waveguides. The results show that the value of the birefringence varies as a function of the diffusion aperture width or with the burying depth. By adding a magneto-optical cover layer, consisting in magnetic nanoparticles doped silica matrix obtained by a sol gel process, we evidence a huge increase of the beating magnitude and a decrease of the modal birefringence.