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Electrothermal and 3D Thermal Model for Lithium Ion Capacitors

机译:锂离子电容器的电热和3D热模型

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摘要

ULTIMO Lithium ion capacitors (LiCs) produced by JM Energy, a sister company of JSR Micro NV, are one of the emerging and innovative technologies in the field of energy storage. Their high power capability, high energy density, long cycle life (more than 2 Million cycles) and wide operating temperature (-30?C to 70?C) make them very unique. They combine the advantages of both traditional electric double layer capacitors (EDLCs) and lithium ion batteries (LiBs). For many customers and producers of energy storage systems, it is mandatory to have a reliable model which is capable of predicting the cell's behavior in different applications. A pure electrical model alone cannot meet the expected accuracy as most parameters in the LIC cells are temperature dependent. Other factors, such as current level and cell aging, impact the behavior of LiCs. As a result, a comprehensive electrothermal model which takes the aging effect into account is required. In industrial applications, LiCs are generally integrated in closed case modules. An accurate 3D thermal model, capable of predicting the surface cell temperature, is therefore crucial. Having a precise thermal model at module level also helps in sizing the adequate cooling system. JSR Micro NV, together with Vrije Universiteit Brussel (VUB), have developed such a highly accurate tool for both cell and module modelling. In the following sections, these models are presented and explained. The accuracy is verified and validated through experimental tests.
机译:JSR Micro NV的姊妹公司JM Energy生产的ULTIMO锂离子电容器(LiC)是储能领域中的新兴技术之一。它们的高功率能力,高能量密度,长循环寿命(超过200万个循环)和宽工作温度(-30?C至70?C)使其非常独特。它们结合了传统双电层电容器(EDLC)和锂离子电池(LiB)的优点。对于许多储能系统的客户和生产商而言,必须具有可靠的模型,该模型能够预测电池在不同应用中的行为。单纯的电气模型无法满足预期的精度,因为LIC单元中的大多数参数都取决于温度。其他因素(例如电流水平和电池老化)会影响LiC的行为。结果,需要考虑到老化效应的综合电热模型。在工业应用中,LiC通常集成在密闭模块中。因此,能够预测表面电池温度的精确3D热模型至关重要。在模块级别具有精确的热模型也有助于确定适当的冷却系统。 JSR Micro NV与布鲁塞尔自由大学(VUB)共同开发了一种高度精确的工具,用于单元和模块建模。在以下各节中,将介绍和解释这些模型。通过实验测试来验证和验证准确性。

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  • 来源
  • 会议地点 Mainz(DE)
  • 作者单位

    JSR Micro N.V., Technoloielaan 8, Leuven, B-3001 Belgium;

    JSR Micro N.V., Technoloielaan 8, Leuven, B-3001 Belgium;

    Vrije Universiteit Brussel, Pleinlaan 2, Brussels, B-1050 Belgium;

    Vrije Universiteit Brussel, Pleinlaan 2, Brussels, B-1050 Belgium;

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  • 原文格式 PDF
  • 正文语种 eng
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