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Growth of short-period InAs/GaSb superlattices for mid-infrared photodetectors

机译:用于中红外光电探测器的短周期InAs / GaSb超晶格的生长

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The purpose of this work is to explore mid-infrared (IR) photodetector materials that can operate at room temperature. Shorter-period InAs/GaSb superlattices (SLs) have larger intervalance band seperations, which is beneficial for reducing Auger recombination and tunneling current, thus making room temperature operation possible. To test these possibilities, several short-period SLs ranging from 50 to 11 A were designed for 4 μm detection threshold and molecular beam epitaxy was used to grow specially designed structures. Since morphological degradation is generally expected in shorter-period SLs, their structural qualities were monitored by transmission electron microscopy. The effect of layer properties on the optical and electrical properties was studied using low temperature photoconductivity measurements and magnetic field dependent Hall measurements. The samples with larger-periods (50 to 31 A) showed excellent structural qualities, leading to sharper photoresponse band edge (5 meV) and lower residual background carrier concentrations (8x10~(10) cm~(-2)). As the period approached 24 A, slight layer thickness undulations within the SLs were observed and these undulations intensified as the period further reduced to 17 A. Evidently, these structural degradations strongly influence their optical properties causing significant broadening in photoresponse band edge (9 meV). In the thinner samples with the period below 17 A, no optical signal was detected. With slower growth rates, samples with periods as thin as 19 A were grown without significant layer thickness variations.
机译:这项工作的目的是探索可以在室温下工作的中红外(IR)光电探测器材料。较短周期的InAs / GaSb超晶格(SL)具有较大的间隔带间隔,这有利于减少俄歇复合和隧穿电流,从而使室温操作成为可能。为了测试这些可能性,针对4μm的检测阈值设计了几种范围从50到11 A的短周期SL,并使用分子束外延生长专门设计的结构。由于通常预期在较短时期的SL中会发生形态退化,因此通过透射电子显微镜监测其结构质量。使用低温光电导率测量和磁场相关霍尔测量研究了层特性对光学和电学特性的影响。具有较大周期(50至31 A)的样品表现出优异的结构质量,导致更尖锐的光响应带边缘(5 meV)和较低的残留背景载流子浓度(8x10〜(10)cm〜(-2))。当周期接近24 A时,在SL中观察到轻微的层厚起伏,随着周期进一步减小到17 A,这些起伏加剧。很明显,这些结构退化强烈影响其光学性能,从而导致光响应带边缘明显变宽(9 meV) 。在周期小于17 A的较薄样品中,未检测到光信号。以较慢的生长速度,生长的样品厚度只有19 A,而层厚度却没有明显变化。

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