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High-speed fluorescence lifetime measurement for investigation of dynamic phenomena

机译:高速荧光寿命测量,用于研究动态现象

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摘要

We present a novel method for high-speed measurements of fluorescence lifetime, in which fluorescence signal for precise lifetime determination is acquired in a short time on the order of microseconds. Our method is based on analog signal that contains a number of fluorescence photons in a pulse, on the contrary to the conventional time-correlated single-photon counting in which only a single photon is permitted for a fluorescence pulse. Because this method does not have any problem of photon counting pile-up, the measurement speed is not limited by the single-photon constraint and can increase up to the excitation repetition rate. In order to extract the accurate lifetime information from the analog signal contaminated by the slow instrumental response function (IRF), we have developed a new signal processing method, in which the lifetime is determined by difference between mean arrival time of the analog photo-electronic pulse of fluorescence signal and one of IRF signal. By both experimental and theoretical studies, we have verified that the measurement accuracy and precision are nearly independent of the width of the IRF so that inexpensive narrow-bandwidth photo-detectors and low-speed electronics can be used for this method. Excellent accuracy and precision have been obtained experimentally for high-speed measurements completed in a few microseconds. These results suggest that our method can be well applied to measurement of fast dynamic phenomena and real time fluorescence lifetime imaging microscope with low cost.
机译:我们提出了一种荧光寿命的高速测量的新方法,其中用于精确寿命确定的荧光信号是在短时间内以微秒为单位获取的。我们的方法基于模拟信号,该模拟信号在一个脉冲中包含多个荧光光子,这与常规的时间相关的单光子计数相反,在传统的时间相关的单光子计数中,荧光脉冲只允许一个光子。因为该方法没有光子计数堆积的问题,所以测量速度不受单光子约束的限制,并且可以提高到激发重复率。为了从慢速仪器响应函数(IRF)污染的模拟信号中提取准确的寿命信息,我们开发了一种新的信号处理方法,其中寿命由模拟光电平均到达时间之间的差值确定脉冲是荧光信号和IRF信号之一。通过实验和理论研究,我们已经验证了测量精度和精度几乎与IRF的宽度无关,因此廉价的窄带宽光电探测器和低速电子设备可用于此方法。对于在几微秒内完成的高速测量,已经通过实验获得了出色的精度和精密度。这些结果表明我们的方法可以很好地应用于低成本的快速动态现象的测量和实时荧光寿命成像显微镜。

著录项

  • 来源
  • 会议地点 San Jose CA(US)
  • 作者单位

    Department of Information and Communications, Gwangju Institute of Science and Technology 1 Oryong-dong, Buk-gu, Gwangju 500-712, Republic of Korea;

    Department of Information and Communications, Gwangju Institute of Science and Technology 1 Oryong-dong, Buk-gu, Gwangju 500-712, Republic of Korea;

    Department of Information and Communications, Gwangju Institute of Science and Technology 1 Oryong-dong, Buk-gu, Gwangju 500-712, Republic of Korea;

    Department of Information and Communications, Gwangju Institute of Science and Technology 1 Oryong-dong, Buk-gu, Gwangju 500-712, Republic of Korea;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    fluorescence lifetime; high speed measurement; mean-delay; accuracy;

    机译:荧光寿命高速测量;平均延迟准确性;
  • 入库时间 2022-08-26 13:47:43

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