Photovoltaic Module Durability and Reliability: Analysis of a 23-Year-Old Array Operating in Quebec, Canada

摘要

CH3NH3PbI3 perovskite films for photovoltaics (PV) have been deposited by vapor deposition and solution processing. Spectroscopic ellipsometry from the near infrared to ultraviolet (0.75 to 5.89 eV) is used to study the optical response of CH3NH3PM3. In-situ spectroscopic ellipsometry is applied to monitor CH3NH3PM3 undergoing degradation in laboratory ambient conditions to study the degradation / decomposition of CH3NH3PbI3 and evolution of unreacted and phase segregated materials (PbI2, CH3NH3I) found at surface / ambient and substrate / film interfaces.