X-ray Fourier-transform Ghost Imaging via Sparsity Constraints

摘要

X-ray Fourier-transform ghost imaging (FGI) provides the feasibility of exploring complex materials at nanoscale with spatially incoherent x rays. However, limited image quality hampers its practical applications. Here we present a method of x-ray FGI with coded diffraction patterns to improve image quality and realize x-ray nanoscope. By introducing mask modulation in the reference path, the sample's diffraction information can be non-locally encoded. A tabletop microscopy system is designed for demonstrating this method, and simulation results show that Fourier-transform diffraction patterns of the sample can be successfully achieved.