Probabilistic Voltage Security Region based on Monte Carlo Reliability Evaluation

摘要

This paper proposes a probabilistic approach for obtaining the security region that combines Reliability Evaluation with Voltage Security Assessment. The approach takes into consideration the probability of occurrence of the network contingencies using Monte Carlo simulation and provides visual information by means of nomograms of the security regions associated with different levels of risk of voltage violation. The computational details are presented for a parallel computing based implementation for on-line application. Results for the IEEE Reliability Test System under heavy and light loads are presented and compared with the deterministic nomograms.