Advances on Compressive Sensing based approaches for inverse scattering

摘要

The application of the Compressive Sensing (CS) paradigm to the solution of three-dimensional inverse scattering problems is discussed. More in detail, the use of CS-based techniques to address linear and sparseness-regularized microwave imaging formulations is discussed, the application of this paradigm to the retrieval of 3D profiles which are voxel-sparse is addressed. A preliminary set of numerical examples is presented to point out advantages and limitations of the considered methodology.