Determination of Bi12SiO20 permittivity and loss tangent in the 220–325 GHz band and the influence of UV exposure on these parameters

著录项

• 来源
  《IEEE International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering》|2020年|576-579|共4页
• 会议地点 Lviv-Slavske(UA)
• 作者

  Paweł Bajurko; Konrad Godziszewski; Yevhen Yashchyshyn; Dmytro Vynnyk; Volodymyr Haiduchok; Ivan Solskii;

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• 作者单位

  Institute of Radioelectronics and Multimedia Technology Warsaw University of Technology Warsaw Poland;

  Lviv Polytechnic National University Lviv Ukraine;

  Branch of PJSC 'Concern-Electron' Scientific Research Company 'Electron-Carat' Lviv Ukraine;

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• 会议组织
• 原文格式 PDF
• 正文语种
• 中图分类
• 关键词

  sillenites; subterahertz frequencies; material characterization; photoinduced carriers; UV radiation;

  机译：硅钙石太赫兹频率;材料表征;光诱导载流子;紫外线辐射;
• 入库时间 2022-08-26 14:42:55