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On the Melting of Ohmic-Heated Nanowires and Electrical Contacts

机译:关于欧姆加热纳米线和电触点的熔化

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摘要

The temperature rise in a nanowire or an electrical contact made from specific materials, due to ohmic heating by a DC electrical current, may lead to uncontrollable thermal runaway with ensuing melting. Thermal runaway stems from a steep decrease with increasing temperature of the thermal conductivity of the conducting material, and subsequent trapping of the ohmic heat in the contact or the wire. This paper evaluates the temperature for the onset of thermal runaway in a nanowire and in a bulk electrical contact. A possible implication for memory devices using ohmic-heated nanofilms or nanowires is also discussed.
机译:由于直流电流的欧姆加热,纳米线或由特定材料制成的电触点中的温度上升,可能导致不可控的热失控,从而导致熔化。热失控源于随着导电材料导热系数的升高温度急剧下降,以及随后欧姆热在接点或导线中的捕获。本文评估了纳米线和体电接触中热失控开始时的温度。还讨论了使用欧姆加热的纳米膜或纳米线的存储设备的可能含义。

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