Monostatic and bistatic RCS measurements for thin metasurfaces

摘要

To reduce the RCS value of the flat and curved target, the patch structure on a 0.1-mm thickness substrate has been proposed and the monostatic RCS reduction is verified through experiment. This paper presents the monostatic and bistatic RCS measurements for thin metasurfaces at TE incidence by using compact range system. The maximum RCS reduction was confirmed at 9.82 GHz, and the simulated and measured results of the monostatic and bistatic RCS patterns agree well.