Dielectric properties of thin-film SrTiO3 grown on LaAlO3 with YBa2Cu3O7-x electrodes

摘要

Abstract: We have fabricated and characterized YBCO (YBa$-2$/Cu$-3$/O$- 7$MIN@x$/) microstrip resonators on LAO (LaAlO$-3$/) substrates that include thin film STO (SrTiO$-3$/) coplanar capacitors to study the dielectric properties of thin film STO. The low frequency capacitance of the STO/LAO capacitor is measured as a function of temperature and dc bias. We use the observed resonant frequencies to extract the microwave frequency capacitance of the structure and the Qs to determine the microwave losses. A conformal map is developed and used to transform the observed capacitances into dielectric constant values for the thin film STO. !8