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Glitch-free implementation of masking in modern FPGAs

机译:现代FPGA中屏蔽的无故障实现

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Due to the propagation of the glitches in combinational circuits side-channel leakage of the masked S-boxes realized in hardware is a known issue. Our contribution in this paper is to adopt a masked AES S-box circuit according to the FPGA resources in order to avoid the glitches. Our design is suitable for the 5, 6, and 7 FPGA series of Xilinx although our practical investigations are performed using a Virtex-5 chip. In short, compared to the original design synthesized by automatic tools while requiring the same area (slice count) our design reduces power consumption, critical path delay, and more importantly the side-channel leakage. In our practical investigations we could not recover any first-order leakage of our design using up to 50 million traces. However, since the targeted S-box realizes a first-order boolean masking, the second-order leakage could be revealed using around 25 million measurements.
机译:由于毛刺在组合电路中的传播,以硬件实现的被掩盖的S盒的侧通道泄漏是一个已知问题。我们在本文中的贡献是根据FPGA资源采用屏蔽的AES S-box电路,以避免出现毛刺。尽管我们的实际研究是使用Virtex-5芯片进行的,但我们的设计适合Xilinx的5、6和7 FPGA系列。简而言之,与由自动工具合成的原始设计(同时需要相同的面积(切片数))相比,我们的设计减少了功耗,关键路径延迟,更重要的是减少了边通道泄漏。在实际调查中,我们无法使用多达5000万条迹线来恢复设计的任何一阶泄漏。但是,由于目标S盒实现了一阶布尔掩蔽,因此可以使用大约2500万次测量来揭示二阶泄漏。

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