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Conditions of arising and nature of the dislocation magnetism of deformed silicon crystals

机译:变形硅晶体的位错磁性的产生条件和性质

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Abstract: The magnetic susceptibility of initial n-Si single crystal with the current carrier concentration 1.2-10$+14$/ cm$+$MIN@3$/ and the same crystals after uniaxial deformation up to 11 percent was measured by the Faraday method at room temperature in the range of 0.1-4 kOe. It was found that initial undeformed silicon samples were diamagnetic ones with susceptibility of $MIN@2.29- 10$+$MIN@7$/ cm$+3$/g-$+1$/ which is independent on the magnetic field strength. The presence of dislocations in silicon crystals essentially influences on the magnetic susceptibility, the dependence of the magnetic susceptibility on the magnetic field being strongly nonlinear. The non-resonance microwave response has been investigated using the ESR spectroscopy technique. The hysteresis of the microwave absorption was observed that is typical for a magnetic ordering. Possible explanation of unusual magnetic properties of silicon and the connection of these property with appearance of microcracks in strongly deformed silicon has been proposed. !9
机译:摘要:用法拉第法测量了初始载流子浓度为1.2-10$+14$/cm$+$MIN@3$/的初始n-Si单晶的磁化率,以及单晶变形后高达11%的相同晶体的磁化率。室温下在0.1-4 kOe范围内的方法。发现初始未变形的硅样品是抗磁性样品,其磁化率为$MIN@2.29-10 $ + $ MIN @ 7 $ / cm $ + 3 $ / g-$ + 1 $ /,而与磁场强度无关。硅晶体中位错的存在本质上影响磁化率,磁化率对磁场的依赖性是强非线性的。已经使用ESR光谱技术研究了非共振微波响应。观察到了微波吸收的磁滞现象,这对于磁排序是典型的。已经提出了可能的解释硅的异常磁特性以及这些特性与强烈变形的硅中的微裂纹的出现的关系的建议。 !9

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