The objective of this study was to measure the peak broadening inherent in chi (X) tilting and compare that to a geometrical model. The (012) and (300) reflections from a Al_2O_3 plate (NIST SRM 1976) were each scanned every 10~0 from -70~0 to +70~0 X (15 tilts/reflection) to examine the influence of a low and high 2 theta, respectively. The absorption correction was not taken into account. The equation y=2m 1|tanX|cos theta + m2 fits well the data from both low and high 2 theta except the point X=0. The extended equation y=m1 cos h(m2 tan X cos theta) fits well with all the experimental points.
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机译：这项研究的目的是测量chi（X）倾斜固有的峰展宽并将其与几何模型进行比较。从Al_2O_3板（NIST SRM 1976）的（012）和（300）反射分别从-70〜0到+ 70〜0 X（15倾斜/反射）每10〜0扫描一次，以检查低和低反射的影响。高2 theta分别。没有考虑吸收校正。除点X = 0外，方程y = 2m 1 | tanX | cos theta + m2非常适合来自低2θ和高2θ的数据。扩展方程y = m1 cos h（m2 tan X cos theta）与所有实验点都非常吻合。
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