Division of Advanced Mechanical Systems Engineering, Tokyo University of Agriculture andTechnology, 2-24-16 Nakacho, Koganei, Tokyo 184-8588, Japan;
Division of Advanced Mechanical Systems Engineering, Tokyo University of Agriculture andTechnology, 2-24-16 Nakacho, Koganei, Tokyo 184-8588, Japan;
Division of Advanced Mechanical Systems Engineering, Tokyo University of Agriculture andTechnology, 2-24-16 Nakacho, Koganei, Tokyo 184-8588, Japan;
Division of Advanced Mechanical Systems Engineering, Tokyo University of Agriculture and Technology, 2-24-16 Nakacho, Koganei, Tokyo 184-8588, Japan;
Evanescent interference field; Total internal reflectio nmicroscopy; Geometric phase shifter; super resolutio nmicroscopy;
机译:用扫描近场光学显微镜直接测量of逝波的干扰
机译:用扫描近场光学显微镜直接测量of逝波的干扰
机译:通过常规光学显微镜和with逝场照明测量纳米颗粒尺寸
机译:常规光学显微镜通过e逝干涉场测量纳米颗粒尺寸
机译:用纳米粒径添加剂的油田水泥的增稠时间,流变学和流体丧失
机译:使用强渐逝场对单个大气微粒进行光学上浆分辨率为10 nm
机译:通过在透射扫描近场光学显微镜配置中使用纳米尺寸探针扰动消逝场来进行谐振波模式的高分辨率测量
机译:使用原位高场磁光显微镜测量超导体中的局部电流