首页> 外文会议>Electrical Insulation and Dielectric Phenomena (CEIDP), 2011 Annual Report Conference on >A Least Squares Support Vector Machines (LS-SVM) approach for predicting critical flashover voltage of polluted insulators
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A Least Squares Support Vector Machines (LS-SVM) approach for predicting critical flashover voltage of polluted insulators

机译:最小二乘支持向量机(LS-SVM)方法来预测受污染绝缘子的临界闪络电压

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摘要

Least Squares Support Vector Machines (LS-SVM) are a class of kernel machines emphasizing on primal-dual aspects in a constrained optimization framework. LS-SVMs aim at extending methodologies typical of classical support vector machines for problems beyond classification and regression. This paper describes a methodology that was developed for the prediction of the critical flashover voltage of polluted insulators by using a Least Squares Support Vector Machines (LS-SVM). The methodology uses as input variables characteristics of the insulator such as diameter, height, creepage distance, form factor and equivalent salt deposit density. The estimation of flashover performance of polluted insulators is based on field experience and laboratory tests are invaluable as they significantly reduce the time and labour involved in insulators design and selection. The majority of the variables to be predicted are dependent upon several independent variables. The results from this work are useful to predict the contamination severity, critical flashover voltage as a function of contamination severity, arc length, and especially to predict the flashover voltage. The validity of the approach was examined by testing several insulators with different geometries. Moreover the performance of the proposed approach with other intelligence method based on ANN is compared. It can be concluded that the LS-SVM approach has better generalization ability that assist the measurement and monitoring of contamination severity, flashover voltage and leakage current.
机译:最小二乘支持向量机(LS-SVM)是一类内核机器,其在受约束的优化框架中强调原始对偶方面。 LS-SVM旨在扩展经典支持向量机的典型方法,以解决分类和回归之外的问题。本文介绍了一种使用最小二乘支持向量机(LS-SVM)预测污染绝缘子的临界闪络电压的方法。该方法将绝缘子的特性(例如直径,高度,爬电距离,形状因数和等效盐沉积密度)用作输入变量。对污染绝缘子闪络性能的评估是根据现场经验得出的,而实验室测试非常宝贵,因为它们可以显着减少绝缘子设计和选择所需的时间和劳动力。要预测的大多数变量都依赖于几个独立变量。这项工作的结果可用于预测污染严重程度,临界闪络电压(取决于污染严重程度,电弧长度),尤其是预测闪络电压。通过测试几种具有不同几何形状的绝缘子,检验了该方法的有效性。此外,比较了所提方法与其他基于人工神经网络的智能方法的性能。可以得出结论,LS-SVM方法具有更好的泛化能力,有助于测量和监视污染严重性,闪络电压和泄漏电流。

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