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Electromagnetic Induction Imaging of concealed metallic objects by means of resonating circuits

机译:通过谐振电路对隐藏的金属物体进行电磁感应成像

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An electromagnetic induction system, suitable for 2D imaging of metallic samples of different electrical conductivities, has been developed. The system is based on a parallel LCR circuit comprising a ferrite-cored coil (7.8 mm × 9.5 mm, L=680 μH at 1 KHz), a variable resistor and capacitor. The working principle of the system is based on eddy current induction inside a metallic sample when this is introduced into the AC magnetic field created by the coil. The inductance of the LCR circuit is modified due to the presence of the sample, to an extent that depends on its conductivity. Such modification is known to increase when the system is operated at its resonant frequency. Characterizing different metals based on their values of conductivity is therefore possible by utilizing a suitable system operated at resonance. Both imaging and material characterization were demonstrated by means of the proposed electromagnetic induction technique. Furthermore, the choice of using a system with an adjustable resonant frequency made it possible to select resonances that allow magnetic-field penetration through conductive screens. Investigations on the possibility of imaging concealed metals by penetrating such shields have been carried out. A penetration depth of δ~3 mm through aluminium (Al) was achieved. This allowed concealed metallic samples- having conductivities ranging from 0.54 to 59.77 MSm~(-1) and hidden behind 1.5-mm-thick Al shields- to be imaged. Our results demonstrate that the presence of the concealed metallic objects can be revealed. The technique was thus shown to be a promising detection tool for security applications.
机译:已经开发出适用于不同电导率的金属样品的2D成像的电磁感应系统。该系统基于一个并联LCR电路,该电路包括一个铁氧体芯线圈(7.8 mm×9.5 mm,在1 KHz下L = 680μH),一个可变电阻器和一个电容器。该系统的工作原理是基于金属样品内部的涡流感应,该感应电流会引入线圈产生的交流磁场中。由于样品的存在,LCR电路的电感会在一定程度上取决于其电导率。已知当系统以其共振频率操作时,这种修改会增加。因此,通过利用在谐振下运行的合适系统,可以根据不同金属的电导率值来表征。成像和材料表征都通过提出的电磁感应技术进行了证明。此外,选择使用谐振频率可调的系统使得选择允许磁场穿透导电屏的谐振成为可能。已经进行了关于通过穿透这样的屏蔽而使隐蔽的金属成像的可能性的研究。穿透铝(Al)的深度达到δ〜3 mm。这样就可以对电导率为0.54至59.77 MSm〜(-1)且隐藏在1.5毫米厚的Al屏蔽层后面的隐蔽金属样品进行成像。我们的结果表明,可以发现隐藏的金属物体的存在。因此,该技术被证明是用于安全应用程序的有前途的检测工具。

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