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Support Vector Machines for Classification of Geometric Primitives in Point Clouds

机译:支持向量机用于点云中几何基元的分类

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摘要

Classification of point clouds by different types of geometric primitives is an essential part in the reconstruction process of CAD geometry. We use support vector machines (SVM) to label patches in point clouds with the class labels tori, ellipsoids, spheres, cones, cylinders or planes. For the classification features based on different geometric properties like point normals, angles, and principal curvatures are used. These geometric features are estimated in the local neighborhood of a point of the point cloud. Computing these geometric features for a random subset of the point cloud yields a feature distribution. Different features are combined for achieving best classification results. To minimize the time consuming training phase of SVMs, the geometric features are first evaluated using linear discriminant analysis (LDA). LDA and SVM are machine learning approaches that require an initial training phase to allow for a subsequent automatic classification of a new data set. For the training phase point clouds are generated using a simulation of a laser scanning device. Additional noise based on an laser scanner error model is added to the point clouds. The resulting LDA and SVM classifiers are then used to classify geometric primitives in simulated and real laser scanned point clouds. Compared to other approaches, where all known features are used for classification, we explicitly compare novel against known geometric features to prove their effectiveness.
机译:通过不同类型的几何图元对点云进行分类是CAD几何重构过程中的重要部分。我们使用支持向量机(SVM)使用点标签tori,椭球,球体,圆锥体,圆柱体或平面来标记点云中的面片。对于基于不同几何特性的分类特征,例如点法线,角度和主曲率。这些几何特征是在点云的点的局部附近估计的。计算点云的随机子集的这些几何特征会产生特征分布。组合不同的功能以获得最佳分类结果。为了最小化SVM的耗时训练阶段,首先使用线性判别分析(LDA)评估几何特征。 LDA和SVM是机器学习方法,需要初始训练阶段才能允许对新数据集进行后续自动分类。对于训练阶段,使用激光扫描设备的模拟生成点云。基于激光扫描仪误差模型的其他噪声被添加到点云。然后将所得的LDA和SVM分类器用于对模拟和实际激光扫描点云中的几何图元进行分类。与使用所有已知特征进行分类的其他方法相比,我们明确地将新颖特征与已知几何特征进行比较以证明其有效性。

著录项

  • 来源
    《Curves and surfaces 》|2014年|80-95|共16页
  • 会议地点 Paris(FR)
  • 作者单位

    Institute for Optical Systems, University of Applied Sciences Constance, Konstanz, Germany;

    Institute for Optical Systems, University of Applied Sciences Constance, Konstanz, Germany;

    Institute for Optical Systems, University of Applied Sciences Constance, Konstanz, Germany;

    Institute for Optical Systems, University of Applied Sciences Constance, Konstanz, Germany;

    Institute for Optical Systems, University of Applied Sciences Constance, Konstanz, Germany;

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  • 正文语种 eng
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