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Investigation of dielectric breakdown probability distribution for double-break vacuum circuit breaker

机译:双断路器真空断路器的介质击穿概率分布研究

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Breakdown probability distribution before and after no-load switching was investigated for a vacuum interrupter made from copper-chromium alloy. Since the multi-break vacuum circuit breaker was considered as a method for realizing a high-voltage vacuum circuit breaker, a double-break vacuum circuit breaker was investigated for breakdown probability distribution. Breakdown probability distribution after no-load switching can be represented by a Weibull distribution in the same manner as before switching. The scatter of breakdown voltage increases when no-load switching is carried out. The shape parameter becomes constant, from 6.0 to 8.5 irrespective of the gap length. If the vacuum circuit breaker uses a double-break, breakdown probability at low voltage becomes lower than single-break probability. Although the double-break vacuum circuit breaker is inequality of potential distribution, its insulation reliability is better than that of the single-break vacuum interrupter even when the inequality of the vacuum interrupter's sharing voltage is taken into account.
机译:研究了由铜铬合金制成的真空灭弧室的空载切换前后的击穿概率分布。由于考虑将多断路器真空断路器作为实现高压真空断路器的方法,因此研究了双断路器真空断路器的击穿概率分布。空载切换后的击穿概率分布可以用与切换前相同的方式由威布尔分布表示。当执行空载切换时,击穿电压的散布会增加。形状参数从6.0到8.5不变,与间隙长度无关。如果真空断路器使用双断,则在低压下的击穿概率将低于单断概率。尽管双断路器真空断路器的电位分布不均,但即使考虑了真空断路器的共享电压的不均,其绝缘可靠性也比单断路器真空断路器的绝缘可靠性要好。

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