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Lateral migration radiography: A new x-ray backscatter imaging technique

机译:横向迁移射线照相:一种新的X射线反向散射成像技术

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A new Compton backscatter imaging (CBI) technique, described as lateral migration radiography (LMR), has been developed and applied successfully to two difficult diagnostic problems: Detection of buried, plastic landmines, and detection of material flaws which lie close to, and parallel to, a surface, the method is based on image contrast generated by alteration of photon lateral migration relative to the illuminating beam direction. It is extraordinarily sensitive to density and/or atomic number variation along the photon lateral-direction travel paths. In LMR, relevant information-carrying photon detection efficiencies are two to three orders-of-magnitude greater than other CBI techniques such that the electric energy requirement for x-ray generation is only about one joule per acquired image pixel. The resulting small product of pixel illumination dwell time and x-ray generator electric power implies that current, easily accessible technology can be used to fabricate LMR systems with practical usage protocols. Three have been designed and built at the University of Florida: A laboratory device for perfecting buried landmine acquisition; a mobile system for field-demonstrating landmine detection; and, a laboratory system for detection of material defects in small structural parts. The LMR images, acquired in a laboratory landmine detection setting, are so definitive that identification of the mine-type, as well as presence, can be often accomplished. Results of a field test are near -perfect, both in determining buried landmine presence and in lack of false positive response. Images acquired in material flaw detection indicate ability to detect lateral cracks or delaminations with thickness less than 100 microns, as well as corrosion on surfaces between layers of structural sheets. These applications provide evidence of the viability of a new, one-sided x-ray radiography technique which images hidden structures of objects which have here-to-fore been difficult, or impossible, to detect with practical image acquisition times.
机译:已经开发出一种新的康普顿背向散射成像(CBI)技术,称为侧向移动射线照相(LMR),并将其成功应用于两个困难的诊断问题:探测掩埋的塑料地雷以及探测接近且平行的材料缺陷相对于表面,该方法基于通过相对于照明光束方向改变光子横向迁移而产生的图像对比度。它对沿光子横向行进路径的密度和/或原子序数变化特别敏感。在LMR中,相关的信息承载光子检测效率比其他CBI技术高2到3个数量级,因此X射线生成所需的电能仅为每个获取的图像像素约一个焦耳。所得到的像素照明停留时间和X射线发生器电功率的较小乘积意味着可以使用当前易于使用的技术来制造具有实际使用协议的LMR系统。佛罗里达大学已设计和建造了三个:完善埋藏式地雷获取的实验室设备;用于现场演示地雷探测的移动系统;以及用于检测小型结构部件中的材料缺陷的实验室系统。在实验室地雷检测装置中获取的LMR图像非常确定,以至于经常可以完成对地雷类型和存在的识别。现场测试的结果在确定埋藏的地雷的存在和缺乏误报方面均接近完美。在材料缺陷检测中获取的图像表明能够检测厚度小于100微米的横向裂纹或分层以及结构板各层之间表面的腐蚀。这些应用提供了一种新的单面X射线射线照相技术的可行性的证据,该技术可以对物体的隐藏结构进行成像,而这些物体迄今为止很难或不可能用实际的图像采集时间进行检测。

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