首页> 外文会议>Conference on organic photonic materials and devices XI; 20090127-29; San Jose, CA(US) >Electron Injection Behavior from the Magnesium Electrode into a Family of Electron-Transporting Amorphous Molecular Materials, α,ω-Bis(dimesitylboryl)oligothiophene
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Electron Injection Behavior from the Magnesium Electrode into a Family of Electron-Transporting Amorphous Molecular Materials, α,ω-Bis(dimesitylboryl)oligothiophene

机译:从镁电极到电子传输非晶态分子材料α,ω-双(二甲磺基)低聚噻吩族中的电子注入行为

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Electron injection behavior from the magnesium (Mg) electrode into a family of electron-transporting amorphous molecular materials, 5,5'-bis(dimesitylboryl)-2,2'-bithiophene (BMB-2T) and 5,5"-bis(dimesityl-boryl)-2,2':5',2"-terthiophene (BMB-3T), in single-layer devices of symmetrical structure was studied. The current density-voltage characteristics of the devices with varying thickness were in agreement with the trap-free space-charge-limited current model. The results suggest that the current is conduction limited and that the contact between BMB-nT (n = 2 and 3) and the Mg electrode is nearly ohmic.
机译:从镁(Mg)电极向电子传输无定形分子材料,5,5'-双(dimesitylboryl)-2,2'-联噻吩(BMB-2T)和5,5“ -bis(在对称结构的单层器件中,研究了二甲硅烷基-硼基)-2,2':5',2“-对噻吩(BMB-3T)。厚度变化的器件的电流密度-电压特性与无陷阱的空间电荷限制电流模型一致。结果表明,电流受到传导限制,BMB-nT(n = 2和3)与Mg电极之间的接触几乎是欧姆。

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