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Characterization of surface qualities of polished optical glass by ellipsometric way

机译:椭圆光学法表征抛光光学玻璃的表面质量

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摘要

Ellipsometry is a technique of surfaces analysis, founded on the measure of light polarization state after reflection on a plane surface. Work consists in characterizing the surface quality of polished optical glass by ellipsometry. The measured ellipsometric parameters enabled us to lead to a correlation with roughness while being based on the theory of Maxwell-Garnett to determine the optical properties of the effective milieu.
机译:椭偏法是一种表面分析技术,其基础是在平面上反射后测量光的偏振态。工作在于通过椭圆偏振法表征抛光的光学玻璃的表面质量。测得的椭偏参数使我们能够与粗糙度相关联,同时基于Maxwell-Garnett的理论来确定有效环境的光学特性。

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