Recent advancements in digital holographic microscopy and its applications

摘要

Digital holograms recorded with a charge coupled device camera array are numerically reconstructed in amplitude and phase through calculation of the Fresnel-Kirchhoff integral. The flexibility offered by the reconstruction process in digital holography allows exploitation of new possibilities of application in microscopy. Through the reconstruction process we will show that it is possible to control image parameters as focus distance, image size and image resolution. We report on recent developments obtained in the numerical reconstruction process of holograms. Novel prospective of application of digital holography in single and multi-wavelengths operation either for display and metrological applications can be explored by those recent achievements. Examples of applications of digital holographic microscopy for characterizing silicon MEMS structures by adopting new procedures are illustrated and discussed.