Method to measure reflection-induced retardance without compensator

摘要

The measurement of reflection-induced retardance of optical devices is the usual case encountered in optical research, development and engineering. This kind of measurement usually can be completed using a linear polarizer and a retarder. A novel method used for the measurement of reflection-induced retardance employing a polarizer and an analyzer is proposed in this paper, the theoretical analysis of the method and an application example are given.