首页> 外文会议>Conference on Nano-Optics and Nano-Structures, Oct 15-16, 2002, Shanghai, China >Measurements of photoconductive switches with an ultrafast scanning tunneling microscope
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Measurements of photoconductive switches with an ultrafast scanning tunneling microscope

机译:用超快速扫描隧道显微镜测量光电导开关

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We present experimental results of time-resolved signals of photoconductive (PC) switches with an ultrafast scanning tunneling microscope, which combines ultrashort laser techniques with scanning tunneling microscope (STM) to obtain simultaneous high temporal and spatial resolution. The picosecond electrical transients were generated by optically exciting the photoconductive switch between a high-speed coplanar strip transmission lines. The measured PC switch demonstrated a linear relation between the amplitudes of the time-resolved pulse signals and the photoconductive currents as well as a linear relation between the amplitudes of the signals and the bias voltage applied to the PC switch. The resolved transient signal in contact mode showed a FWHM of 3.2 ps, and the transient signals in non-contact mode were from the capacitive coupling between the tip and the coplanar transmission line.
机译:我们用超快速扫描隧道显微镜介绍光电导(PC)开关的时间分辨信号的实验结果,该技术将超短激光技术与扫描隧道显微镜(STM)结合在一起,可同时获得高时间和空间分辨率。皮秒级的电气瞬变是通过光学激励高速共面带状传输线之间的光电导开关而产生的。所测量的PC开关表现出时间分辨的脉冲信号的幅度与光电导电流之间的线性关系,以及信号的幅度与施加至PC开关的偏置电压之间的线性关系。接触模式下解析的瞬态信号显示的FWHM为3.2 ps,非接触模式下的瞬态信号来自尖端与共面传输线之间的电容耦合。

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