首页> 外文会议>Conference on Laser Interferometry X: Techniques and Analysis 31 July-1 August 2000 San Diego, USA >Low-coherence videoholography for sub-surfacxe deformation measurements in layered objects
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Low-coherence videoholography for sub-surfacxe deformation measurements in layered objects

机译:低相干全息术用于分层物体中亚表面变形的测量

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TV-holography or electronic speckle pattern interferometry (ESPI) is used for the detection of micro-deformations on a variety of optically rough surfaces. These deformations are often a result of processes in the whole volume. If the investigated object is, for example, composed of different layers the interaction between these layers can result in a deformation of the surface. Such effects are often seen on antique paintings and result in a net-like structure of cracks, the so-called craquelee. To understand these processes it is necessary to measure the movement of each layer separately. ESPI can be used for sub-surface deformation measurements on layered objects, when it is operated with a low-coherence light source like a superluminescense diode as used in optical coherence tomography. Interferometric information is only registered if the difference between the path length of object and reference beam is less than the coherence length. By changing the path length of one of the beams it is possible to select the region where deformations will be measured even if it is located below the surface, provided the light penetrates the material sufficiently. A serious problem is the separation of the coherent light and the incoherent background. This is performed by a combination of spatial phase shift (SPS) and Fourier filtering.
机译:电视全息或电子散斑图干涉仪(ESPI)用于检测各种光学粗糙表面上的微变形。这些变形通常是整个体积过程的结果。如果所研究的对象例如由不同的层组成,则这些层之间的相互作用会导致表面变形。这种效果经常出现在古董画上,并导致网状结构的裂缝,即所谓的裂纹。要了解这些过程,必须分别测量每一层的运动。当使用低相干光源(如用于光学相干断层扫描的超发光二极管)操作时,ESPI可以用于分层对象的亚表面变形测量。仅当物体和参考光束的路径长度之差小于相干长度时,才注册干涉信息。通过改变光束之一的路径长度,即使光线位于表面下方,只要光线充分穿透材料,就可以选择将要测量变形的区域。一个严重的问题是相干光和非相干背景的分离。这是通过空间相移(SPS)和傅立叶滤波的组合来执行的。

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