首页> 外文会议>Conference on Laser Interferometry X: Techniques and Analysis 31 July-1 August 2000 San Diego, USA >Evaluation of phase changes of interferograms during continuous deofrmations
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Evaluation of phase changes of interferograms during continuous deofrmations

机译:连续脱膜过程中干涉图的相位变化评估

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摘要

A method for measurement of continuous displacements and deformations is presented. The method may be used in e.g. speckle interferometry, moire, structured light and other optical measurement methods based on evaluation of phase changes. The initial random phase of the interference pattern is either known or evaluated before displacement take place using e.g. phase shifting. The changing phase thereafter is achieved only from one image at a time by a least square algorithm. The techndique can be used for measuring shape deformations such as transients and other dynamic events, heat expansion as well as other phenomena where it is difficult to accomplish phase shifting during deformation.
机译:提出了一种测量连续位移和变形的方法。该方法可以用于例如。斑点干涉法,莫尔条纹,结构光和其他基于相位变化评估的光学测量方法。干涉图样的初始随机相位是已知的,或者在例如使用图1进行移位之前进行评估。相移。此后,仅通过最小二乘算法一次仅从一张图像中获得变化的相位。该技术可用于测量形状变形,例如瞬变和其他动态事件,热膨胀以及变形过程中难以完成相移的其他现象。

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