首页> 外文会议>Conference on fiber lasers VI: Technology, systems, and applications; 20090126-29; San Jose, CA(US) >Modeling the photodegradation of large mode area Yb-doped fiber power amplifiers
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Modeling the photodegradation of large mode area Yb-doped fiber power amplifiers

机译:模拟大模面积掺Yb光纤功率放大器的光降解

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Photodarkening is presently a major concern for the long term reliability and efficiency of high power Yb-doped fiber lasers and amplifiers. This phenomenon has been associated with the formation of color centers in the fiber core of single-clad and large mode area Yb-doped fibers. However, its origin is still not well understood and to date no comprehensive model that could predict the lifetime of Yb-doped fiber-based devices has been put forward. A semi-empirical approach seems at the moment the best way to gain a better understanding of the growth behavior of photo-induced losses in Yb-doped fibers in the presence of both photodarkening and photobleaching processes. A rate equation describing the activation and deactivation of color centers involving stretched exponential functions has been developed. For this approach to be effective and reliable, a minimum of parameters is used, four to describe photodarkening and three for photobleaching. A large mode area Yb-doped fiber fabricated at INO using the MCVD process has been characterized. By properly choosing the initial pumping conditions, each parameter of the stretched exponential functions has been measured separately from the others. The model has then been used to simulate the power decay from a 1 kW, 10 ns-pulse, 100 kHz Yd-doped LMA fiber power amplifier. We show that the photodarkening behavior predicted by the model is in good agreement with the experimental results over more than 6000 hours. Such a model is general in its application but the stretched exponential parameters are unique to the type of fiber tested. The model will be a useful characterization tool for developing photodarkening-resistant fibers and for evaluating the lifetime of Yb-doped fiber-based devices affected by photodegradation.
机译:目前,光暗化是高功率掺Yb光纤激光器和放大器的长期可靠性和效率的主要关注点。这种现象与在单包层和大模面积掺Yb光纤的光纤芯中形成色心有关。然而,其起源仍未得到很好的理解,迄今为止,还没有提出可以预测掺Yb的光纤基器件寿命的综合模型。目前,半经验方法似乎是更好地了解在存在光暗化和光漂白过程的情况下,掺Yb光纤中光致损耗的生长行为的最佳方法。已经开发出描述包含拉伸指数函数的色心的激活和去激活的速率方程。为了使该方法有效且可靠,使用了最少的参数,其中四个参数用于描述光暗化,而三个参数用于光漂白。已经表征了使用MCVD工艺在INO制造的大模面积掺Y光纤。通过正确选择初始泵送条件,可以分别测量拉伸指数函数的每个参数。然后,该模型已用于模拟1 kW,10 ns脉冲,100 kHz掺Yd的LMA光纤功率放大器的功率衰减。我们表明,该模型预测的光暗化行为与超过6000小时的实验结果非常吻合。这种模型在其应用中是通用的,但是拉伸指数参数对于所测试的纤维类型是唯一的。该模型将是开发耐光暗化纤维和评估受光降解影响的掺Yb纤维基器件寿命的有用表征工具。

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