Nano-metrology of macro-systems

摘要

In this paper, a small scale laboratory strainmeter for measuring relative strains is presented. The instrument is a high resolution homodyne interferometer with polarizing optics and special designed electronics for analyzing the output signal of the interferometer. Resolution of the order of λ/8 is obtained in the first instance, with the possibility of improvement by electronic means. Measurement range could vary from microns in the case of earth strains to meters in the case of industrial applications.